Semiconductors and electronic test
Wafer-level maps, device I-V and C-V characterisation, and the link-margin plots that qualify a serial interface. Semiconductor data mixes scales aggressively: the same transistor sweep spans picoamps to milliamps, and a bit-error rate is only interpretable over ten decades, so a linear axis is usually the wrong default.
C-V measurement and the doping profile extracted from it
C-V measurement and the doping profile extracted from it
MOSFET output characteristics, swept smoothly in gate voltage
MOSFET output characteristics, swept smoothly in gate voltage